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Morphological Studies of ZrO2 Prepared by Thermal Evaporation Technique

A. Mohamed Saleem, V. Fairose, M.T. Sadad Abdussamad, R. Abinaya, S. Kathoon Sanofer, B. Madhumitha, A. Ayeshamariam, M. Jayachandran

Abstract


Zirconium is the rare earth element used as superconductive element at low temperatures. It is extensively used for the chemical industry to protect corrosion alkalis and seawater. It is naturally acting as an insulator; it is very much helpful to the optoelectronic devices when it is used as oxides. ZrO2 is synthesized by using combustion synthesis, the as-prepared samples were pelletized, and this pellet was used in the thermal evaporation technique. 1×10-3 mbar vacuum was used as backing device for diffusion pump which ultimately created a vacuum of the order of 10-5 mbar. The thickness of thin film was nearly 56 µm, crystal size varied from 10.31 nm to 74.42 nm, the band gap values observed through PL analysis was nearly 3.16 eV and UV analysis was 2.999 eV. Reported results are discussed here. 

Keywords: PL, UV-Vis, XRD, thermal evaporation technique 


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References


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